Library

Analysis

Structured analysis of a method or technology.

156 entries

CTP to CTC: EV Battery Integration Evolution

How eliminating modules in CTP and CTC battery designs reshapes space efficiency, thermal management, and crash safety for electric vehicles.

CTPCTCEV batterythermal managementcrash safetycell integration

CD-SEM Metrology: Breaking Barriers Below 7nm

An analyst's view of CD-SEM technical barriers in sub-7nm nodes, covering e-beam optics, LER/LWR algorithms, and domestic replacement progress.

CD-SEMsemiconductor metrologye-beam opticsline edge roughnessnon-destructive metrology

Standard Wars in Fiber Optics: The Preform Core Battle

Why the standards battle in fiber optics has shifted to the preform core in the AI computing era, and how Chinese firms can gain strategic advantage.

fiber opticsAI computingstandardspatentsmulticore fiberpreformintellectual property

Vanadium Flow Battery Electrolyte Decay and Regeneration

Long-duration vanadium flow batteries face electrolyte decay from impurity buildup. Electrochemical and chemical regeneration methods offer distinct cost and engineering trade-offs.

vanadium flow batteryelectrolyte regenerationvanadium recoverylong duration storageimpurity accumulation

NDT for Carbon Fiber Aircraft Fuselages: A Comparative Review

A comparative analysis of ultrasonic phased array, X-ray CT, and infrared thermography for detecting disbonds, delaminations, and porosity in carbon fiber aircraft fuselages.

nondestructive testingcomposite materialsaviationultrasonic phased arrayX-ray CTinfrared thermography

China's EDA Tools Advance in Backend and Analog

Domestic EDA vendors gain share in point tools like OPC and DRC, but full-flow ecosystem faces IP validation and foundry PDK adaptation hurdles.

EDAsemiconductordomestic substitutiondigital backendanalog simulationOPCDRCPDKIP validation

China's EDA Tools Advance in Backend and Analog Simulation

Domestic EDA tools gain traction in point solutions like OPC and DRC, but full-flow ecosystem faces IP verification and foundry PDK adaptation hurdles.

EDAsemiconductordomestic substitutiondigital backendanalog simulationOPCDRCfoundry PDKIP verification